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Viser: Atomic Force Microscopy
Atomic Force Microscopy
Peter Eaton og Paul West
(2018)
Sprog: Engelsk
Oxford University Press
676,00 kr.
Print on demand. Leveringstid vil være ca 2-3 uger.
Detaljer om varen
- Paperback: 258 sider
- Udgiver: Oxford University Press (Juni 2018)
- Forfattere: Peter Eaton og Paul West
- ISBN: 9780198826286
Atomic force microscopy (AFM) is an amazing technique that allies a versatile methodology (that allows measurement of samples in liquid, vacuum or air) to imaging with unprecedented resolution. But it goes one step further than conventional microscopic techniques; it allows us to make measurements of magnetic, electrical or mechanical properties of the widest possible range of samples, with nanometre resolution.
This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
This book will demystify AFM for the reader, making it easy to understand, and to use. It is written by authors who together have more than 30 years experience in the design, construction, and use of AFMs and will explain why the microscopes are made the way they are, how they should be used, what data they can produce, and what can be done with the data. Illustrative examples from the physical sciences, materials science, life sciences, nanotechnology and industry demonstrate the different capabilities of the technique.
1. Introduction2. Instrumental Aspects of AFM3. AFM Modes4. Measuring AFM Images5. Image Processing in AFM6. Image Artifacts in AFM7. Applications of AFMAppendix
1: AFM Standards and Calibration SpecimensAppendix
2: AFM Software
1: AFM Standards and Calibration SpecimensAppendix
2: AFM Software
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